ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,139, issued on Aug. 18, was assigned to Lenovo (Singapore) Pte. Ltd. (Singapore). "Keyboard device and electronic apparatus" was invented b... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,140, issued on Aug. 18, was assigned to XIAMEN HONGFA ELECTRIC POWER CONTROLS Co. LTD. (Xiamen, China). "Multi-phase electromagnetic relay"... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,141, issued on Aug. 18, was assigned to SHOALS TECHNOLOGIES GROUP LLC (Portland, Tenn.). "Lead assembly with an integral fuse" was invented... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,142, issued on Aug. 18, was assigned to Plansee SE (Reutte, Austria). "Rotor component for a rotary X-ray anode" was invented by Christian ... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,143, issued on Aug. 18, was assigned to NHV Corp. (Kyoto, Japan). "Electron beam irradiation device" was invented by Tomonori Shirahashi (K... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,144, issued on Aug. 18, was assigned to Sumitomo Heavy Industries Ion Technology Co. Ltd. (Tokyo). "Ion generation device and ion implanter... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,145, issued on Aug. 18, was assigned to Hitachi High-Tech Corp. (Tokyo). "Stage device, charged particle beam apparatus, and vacuum apparat... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,146, issued on Aug. 18, was assigned to HITACHI LTD. (Tokyo). "Sample holder, electron microscope system and sample observation method" was... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,147, issued on Aug. 18, was assigned to ASML NETHERLANDS N.V. (Veldhoven, Netherlands). "Charged-particle optical device" was invented by M... Read More
ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,148, issued on Aug. 18, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam device, charged particle beam system, and a... Read More